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GTC ON-DEMAND

Product & Building Design
Presentation
Media
Deep Learning for Automated Defect Detection in Semiconductors
Abstract:

We'll discuss deep learning practices used in semiconductor processes. Semiconductor processes produce a wide variety of data, including image data produced during inspection that can be used to verify if the process was normal. We explain why the problem isn't one of simple image classification, and how it's essential to consider the characteristics of the semiconductor process for accurate results. We'll also describe challenges we faced and how have we solved these problems.

 
Topics:
Product & Building Design, Industrial Inspection
Type:
Talk
Event:
GTC Silicon Valley
Year:
2019
Session ID:
S9920
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