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GTC ON-DEMAND

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Abstract:
We'll discuss in depth the design choices that went into a high-performance implementation of a high-throughput, large 2D histogram generator (or joint probability distribution). These histograms can be useful for analyzing multiple, simultaneous phenomena. We'll describe the design options, which include optimizing memory choices for access patterns, re-use, and write locations, and we'll show benchmark results from alternate designs and implementations.
We'll discuss in depth the design choices that went into a high-performance implementation of a high-throughput, large 2D histogram generator (or joint probability distribution). These histograms can be useful for analyzing multiple, simultaneous phenomena. We'll describe the design options, which include optimizing memory choices for access patterns, re-use, and write locations, and we'll show benchmark results from alternate designs and implementations.  Back
 
Topics:
Industrial Inspection, Performance Optimization
Type:
Talk
Event:
GTC Silicon Valley
Year:
2019
Session ID:
S9734
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